Here's a breakdown:

Resolution:

* Electron microscopes (EMs) have higher resolution than light microscopes, meaning they can see smaller objects. They can resolve features down to the nanometer scale, which is about 100,000 times smaller than what a light microscope can see.

* Scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) have even higher resolution than EMs. They can image individual atoms, reaching a resolution of less than a nanometer.

Information:

* Electron microscopes provide detailed structural information about the sample's surface or internal structure. They can also give information about the sample's elemental composition.

* Scanning tunneling microscopes can provide information about the electronic properties of surfaces, such as the energy levels of atoms.

* Atomic force microscopes can measure the forces between the tip and the sample surface, which can be used to study the mechanical properties of materials.

So, which is "more powerful"?

It depends on the specific application.

* For resolving extremely small features: STMs and AFMs are more powerful than EMs.

* For detailed structural analysis and elemental composition: EMs are more powerful.

In short, there's no single answer to which is "more powerful". The best instrument depends on the specific question you're trying to answer and the properties you want to study.